The author has produced a detailed exposition that should be of great interest to graduate students and scientists involved with microscopy based on electron beam–specimen interaction.
The text centers on simulation methods ranging from Monte Carlo methods to single-slice and multiple-slice methods, as well as Bloch waves or Bloch states, which can be solved via the electron beam Schrödinger equation. The author carefully provides examples that show the applicability of each of these methods.
Furthermore, readers interested in inelastic and elastic scattering will find very useful cases where the simulations and the electron beam–specimen interaction work well together. Radiation-specific inelastic electromagnetic scattering is also addressed and requires specific simulation methods, which are based on boundary element methods. This excellent text is also supported by extended literature references at the end of each chapter.
Review by Axel Mainzer Koenig, CEO, 21st Century Data Analysis, a division of Koenig & Associates, Inc. Portland, Ore., USA
The opinions expressed in the book review section are those of the reviewer and do not necessarily reflect those of OPN or OSA.