The book, including 34 chapters, is structured in three parts: fundamentals of optical elements and devices, fundamentals of principles and techniques for metrology, and practical applications.
 
Contributed to by experts in academia and industry, this second edition features ten updated chapters and four new chapters, which cover coherence tomography, interference microscopy, dimensional measurements by imaging, and optical metrology for manufacturing.
 
Combining introductory descriptions of the fundamentals with a comprehensive repertory of applications, the book is an invaluable reference for scientists and engineers starting to work in the field of metrology and a practical guide for applications in research and industry.
 
Review by Silvano Donati, University of Pavia, Italy
 
The opinions expressed in the book review section are those of the reviewer and do not necessarily reflect those of OPN or OSA.