This third edition includes many additions, including a brand new chapter on device reliability. Schroder offers a unique and exhaustive coverage of all the measurements for semiconductor characterization—from the electrical techniques (resistivity and contact resistance, carrier doping, defects and trapped charges, lifetime, mobility) to the optical and chemical/physical techniques. The book is well-illustrated and provides an ample bibliography.
Review by OSA Fellow and Emeritus Member Silvano Donati, emeritus professor, University of Pavia, Italy
The opinions expressed in the book review section are those of the reviewer and do not necessarily reflect those of OPN or OSA.