Imaging and metrology are among the earliest applications of optics, with origins in antiquity. This volume provides a readable overview of the state-of-the-art in optical imaging and metrology. About half of the 17 chapters concern holographic techniques, with the others giving a clear picture of metrology technologies, including micro- and nanometrology. These chapters offer a solid background for the use of both. The book should therefore be useful in research and development. It is further enhanced by the chapter entitled The Role of Intellectual Property Protection in Creating Business in Optical Metrology, which is applicable to many fields.

Review by K. Alan Shore, Bangor University, School of Electronic Engineering, Bangor, Wales, United Kingdom.

The opinions expressed in the book review section are those of the reviewer and do not necessarily reflect those of OPN or OSA.