Because the U.S. supplies much of the interferometric measurement hardware and software used these days, the ANSI/NAPM IT.11 Subcommittee on Interferometric Testing has been asked to take the lead in formulating standards for interferometric measurement of wavefront error and surface roughness. As OPN went to press, the committee was scheduled to discuss several related isssues at the OSA Annual Meeting Oct. 3-8 in Toronto.
One item the committee is considering is the rather mundane question of how to define "peak-to-valley" error. The widely used but naive answer is the lowest valley subtracted from the highest peak. A little thought shows that finding these two extremes depends on the spatial sampling density and the alignment of the sampling grid with the surface in question.
This article is only available as a PDF.
Publish Date: 01 November 1993
Log in or Become a member to view the full text of this article.
This article may be available for purchase via the search at Optica Publishing Group.
Optica Members get the full text of Optics & Photonics News, plus a variety of other member benefits.
Hubble Space Telescope: Restoring the Image
Development of the Second Generation Wide Field Planetary Camera for HST
Engineering the COSTAR
Optical Testing and Verification on HST
Polarization Experiments with Light Waves
Lighting a Better Path to 3D-Printed Hydrogels
Computer-Generated Phase-Only Holograms for 3D Displays: A MATLAB Approach
Reconfigurable Metasurfaces Control Light Precisely