ADVERTISEMENT

Stitching Interferometry: A Flexible Solution for Surface Metrology

Paul Murphy, Greg Forbes, Jon Fleig, Paul Dumas and Marc Tricard

The fabrication of large high-quality optics continues to be a challenge, in part because of the difficulty of measuring extensive surface areas. One alternative is to measure many subapertures of the surface and “stitch” the results together to synthesize a full aperture map.

This article is only available as a PDF.

Download PDF

Publish Date:

Stitching Interferometry: A Flexible Solution for Surface Metrology

Paul Murphy, Greg Forbes, Jon Fleig, Paul Dumas and Marc Tricard

The fabrication of large high-quality optics continues to be a challenge, in part because of the difficulty of measuring extensive surface areas. One alternative is to measure many subapertures of the surface and “stitch” the results together to synthesize a full aperture map.

Log in or Become a member to view the full text of this article.

This article may be available for purchase via the search at Optica Publishing Group.

Optica Members get the full text of Optics & Photonics News, plus a variety of other member benefits.

Publish Date: 01 May 2003


Add a Comment

Share this Article

ADVERTISEMENT
ADVERTISEMENT