Test and Measurement: Spatial Profile, Power, Wavelength and Linewidth Measurement Computerizations Alternatives

Forrest discusses the trade-offs of stand-alone instruments versus integrated measurement systems for the measurement of beam power, spatial distribution, linewidth, and wavelength parameters. He also anticipates future trends in computerized instrumentation.

Become a member of OSA or log in to view the full text of this article.

OSA Members get the full text of Optics & Photonics News, plus a variety of other member benefits.


Add a Comment

comments powered by Disqus