Test and Measurement: Spatial Profile, Power, Wavelength and Linewidth Measurement Computerizations Alternatives

Forrest discusses the trade-offs of stand-alone instruments versus integrated measurement systems for the measurement of beam power, spatial distribution, linewidth, and wavelength parameters. He also anticipates future trends in computerized instrumentation.

Access to the full text of this article is restricted. In order to view this article please log in.


Add a Comment

comments powered by Disqus