Scatterings
Fiber-Based Ellipsometry for Studying Thin Films
A group of researchers demonstrated that accurate polarization-based measurements can be achieved when the probe beam passes through an optical fiber of varying birefringence
3-D projection of the polarization state of the light exiting the fiber on the Poincaré sphere.
Dutch Institute for Fundamental Energy Research
Traditional ellipsometry, a method for measuring the dielectric properties of thin films, requires precise knowledge of the light beam polarization that probes the sample. A group led by Feng Liu and Chris J. Lee of the Dutch Institute for Fundamental Energy Research (formerly FOM Institute for Plasma Physics Rijnhuizen in the Netherlands) demonstrated that accurate polarization-based measurements can be achieved even when the probe beam passes through an optical fiber of varying birefringence (Opt. Express 20, 870).
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