Fiber-Based Ellipsometry for Studying Thin Films

A group of researchers demonstrated that accurate polarization-based measurements can be achieved when the probe beam passes through an optical fiber of varying birefringence

Become a member of OSA or log in to view the full text of this article.

OSA Members get the full text of Optics & Photonics News, plus a variety of other member benefits.

Add a Comment

comments powered by Disqus