Stitching Interferometry: A Flexible Solution for Surface Metrology

The fabrication of large high-quality optics continues to be a challenge, in part because of the difficulty of measuring extensive surface areas. One alternative is to measure many subapertures of the surface and “stitch” the results together to synthesize a full aperture map.

Become a member of OSA or log in to view the full text of this article.

OSA Members get the full text of Optics & Photonics News, plus a variety of other member benefits.


Add a Comment

comments powered by Disqus