Femtosecond X-Ray Diffraction

Andrea Cavalleri, Craig W. Siders, Klaus Sokolowski-Tin - ten,Csaba Tóth,Christian Blome, Jeff A.Squier, Dietrich von der Linde, Christopher P.J.Barty, and Kent R.Wilson

By combining traditional x-ray techniques for structural determination with the time resolution of ultrafast laser spectroscopy, researchers are beginning to measure atomic rearrangements directly.

Access to the full text of this article is restricted. In order to view this article please log in.


Add a Comment

comments powered by Disqus