Simplification of Scratch-Dig standards proposed

The standardization of surface imperfections, or Scratch-Dig standards, was discussed in the last Standards column (Optics News, Sept. 1987, p. 31) on the ISO/TC 172/SC1 meeting held in Thun, Switzerland, in May 1987. As we reported, an instrument developed by Lionel Baker at SIRA called the Microscopic Image Comparator (MIC) shows great promise in helping to quantify various surface defects into specific classifications.

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